
Instrumentation Development
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Fig 1 – Precision Rotary Stage with 50mm Wafer Undertest (left).
Fig 2 – Slot Inspection Workstation (right). |
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Fig 2 – Partial View of DAQ
and Temperature Sensors. |
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| Fig 1 – TMS-01 In QA Lab (left). Fig 3 – Temperature Logging System at CMM in QA Lab (right). | ||